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Multiple Scan Base Partitioning Technique to Increase the Throughput in VLSI Testing
Among any testing methods, scan testing is very significant for both in built and external schemes. The performance of the system should get maintained so the throughput plays major role. This paper tells about the retaining data which is hold technique and the jump process is attached to improve the throughput in VLSI testing. In order to achieve better performance the throughput is achieved by transferring the data per time and this gets increased constantly. The data in the partitions shifted sequentially when scan condition is on and when it is off the data may get corrupted so the system invalidate the testing process, the loss may get increase. In-order to solve the problem the data should get retained when the scan condition is not activated and to this process the jump technique is connected. The jump process connects to the output port when the condition is off. When compared to the first stage hold process this multiple partitions is beneficial. The implemented technique helps for the priority data, data rate and also to increase the throughput value approximately 85% to 87% as the clock frequency get reduced in the testing side. The area is reduced by 23.01% with the help of ISCAS benchmark circuit S5378when compared to the first stage hold technique where the benchmark helps to test the system.
Hold Technique, Jump Technique, Multiple Scan Base Partition, Throughput, VLSI Testing.
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