Indian Journal of
Science and Technology
 
 
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Issue No:10, Vol.3
Oct - 2010
ISSN: 0974-5645
RESEARCH ARTICLES Viewers & PDF
3. Six sigma based exponentially weighted moving average control chart.   R. Radhakrishnan and P. Balamurugan.  Indian J.Sci.Technol. Vol. 3, Issue 10, pp: 1052-1055. Domain site: http://www.indjst.org.

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  • Abstract
    A control chart is a statistical device used for the study and control of repetitive process. Shewhart (1931) of bell telephone laboratories suggested control charts based on the 3 sigma limits. Now the companies started applying 6 sigma initiatives in their manufacturing process, which results in lesser number of defects, are focused in identifying the causes due to assignable causes of variation. The companies practicing 6 sigma initiatives is expected to produce 3.4 or less number of defects per million opportunities, a concept suggested by Motorola (1980). If the companies practicing 6 sigma initiatives use the control limits suggested by Shewhart, then no point fall outside the control limits because of reduced variation. In this paper an attempt is made to construct a 6 sigma based exponentially weighted moving average control chart specially designed for the companies adopting 6 sigma initiatives in their organization. Suitable table is also constructed and presented for the engineers to take quick decisions.
  • Keywords: Six sigma quality level, control chart, process control, six sigma.